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Title:

SI-traceable absolute distance measurement over more than 800 meters with sub-nanometer interferometry by two-color inline refractivity compensation

Author(s): K. Meiners-Hagen, T. Meyer, J. Mildner and F. Pollinger
Journal: Applied Physics Letters
Year: 2017
Volume: 191194
Pages: 111
DOI: 10.1063/1.5000569

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